Ultra-high resolution optical coherence tomography for encapsulation quality inspection

Applied Physics B: Lasers and Optics

Volumn 105, Issue 3, 2011, Pages 649-657

  Czajkowski, J ^a   Fabritius, T ^a   Ulanski J ^b   Marszalek T ^b   Gazicki Lipman, M ^b   Nosal, A ^b   Sliz R ^a   Alarousu, E ^c   Prykari T ^a   Myllyla R ^a   Jabbour, G ^a,c  

^a UNIVERSITY OF OULU   (Finland)

^b LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

^c KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

ENCAPSULATION LAYER; MODE-LOCKED; PARYLENE C; PRINTED ELECTRONICS; PROTECTIVE LAYERS; QUALITY INSPECTION; SUBMICRON RESOLUTION; ULTRAHIGH RESOLUTION;

LASER ACCESSORIES; MICHELSON INTERFEROMETERS; OPTICAL TOMOGRAPHY; ORGANIC FIELD EFFECT TRANSISTORS; PHOTONIC CRYSTAL FIBERS; SAPPHIRE;

SATURABLE ABSORBERS;

EID: 84859698674     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-011-4699-5     Document Type: Conference Paper

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