Optical coherence tomography as a method of quality inspection for printed electronics products

Optical Review

Volumn 17, Issue 3, 2010, Pages 257-262

  Czajkowski, Jakub ^a   Prykäri, Tuukka ^a   Alarousu, Erkki ^a   Palosaari, Jaakko ^a   Myllylä, Risto ^a  

^a UNIVERSITY OF OULU   (Finland)

Author keywords

Imaging; Low coherence interferometry; Non invasive; Optical measurement; Printed electronics

Indexed keywords

EID: 77953491569     PISSN: 13406000     EISSN: 13499432     Source Type: Journal    
DOI: 10.1007/s10043-010-0045-0     Document Type: Article

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