메뉴 건너뛰기




Volumn 110, Issue 11, 2011, Pages

Capacitance study of inversion at the amorphous-crystalline interface of n-type silicon heterojunction solar cells

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; CRYSTALLINE SILICONS; FORWARD BIAS; HOLE DENSITIES; INTERFACE RECOMBINATION; N TYPE SILICON; STRONG INVERSION;

EID: 84859356952     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3663433     Document Type: Article
Times cited : (27)

References (13)
  • 4
    • 42549164617 scopus 로고    scopus 로고
    • Determination of the conduction band offset between hydrogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements
    • DOI 10.1063/1.2907695
    • J. P. Kleider, A. S. Gudovskikh, and P. Roca i Cabarrocas, Appl. Phys. Lett. 92, 162101 (2008). 10.1063/1.2907695 (Pubitemid 351590698)
    • (2008) Applied Physics Letters , vol.92 , Issue.16 , pp. 162101
    • Kleider, J.P.1    Gudovskikh, A.S.2    Roca I Cabarrocas, P.3
  • 6
    • 0016510970 scopus 로고
    • 10.1063/1.321865
    • D. L. Losee, J. Appl. Phys. 46, 2204 (1975). 10.1063/1.321865
    • (1975) J. Appl. Phys. , vol.46 , pp. 2204
    • Losee, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.