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Volumn 98, Issue 17, 2011, Pages

Low voltage electron diffractive imaging of atomic structure in single-wall carbon nanotubes

(8) Kamimura, Osamu a,b Maehara, Yosuke b Dobashi, Takashi a Kobayashi, Keita c Kitaura, Ryo c Shinohara, Hisanori c Shioya, Hiroyuki d Gohara, Kazutoshi b

a HITACHI LTD (Japan)

b HOKKAIDO UNIVERSITY (Japan)

c NAGOYA UNIVERSITY (Japan)

d MURORAN INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE STRUCTURES; ATOMIC STRUCTURE; ATOMIC-SCALE ANALYSIS; DIFFRACTIVE IMAGING; INTENSITY DIFFERENCE; LOW VOLTAGES; LOW-VOLTAGE; SINGLE-CARBON ATOMS; SINGLE-WALL CARBON NANOTUBES; THREE-DIMENSIONAL (3D);

ATOMS; CARBON NANOTUBES; ELECTRON DIFFRACTION; THREE DIMENSIONAL;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 79955688519 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3582240 Document Type: Article

Times cited : (23)

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