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Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 11, 2012, Pages

Kinetics of a-Si:H bulk defect and a-Si:H/c-Si interface-state reduction

(3) De Wolf, Stefaan a Ballif, Christophe a Kondo, Michio b

a EPFL (Switzerland)

b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84859017999 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.85.113302 Document Type: Article

Times cited : (76)

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