![]() |
Volumn 106, Issue 4, 2012, Pages 853-861
|
Photothermal laser processing of thin silicon nanoparticle films: On the impact of oxide formation on film morphology
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AIR PRESSURES;
AVERAGE DIAMETER;
COMPARATIVE EXPERIMENTS;
CW-LASER;
EXPERIMENTAL PARAMETERS;
FILM MORPHOLOGY;
GRANULAR STRUCTURESS;
IN-VACUUM;
LASER POWER;
LASER PROCESS;
LASER SPOT SIZE;
MECHANISTIC ASPECTS;
MESOPOROUS;
MICROSCOPIC TECHNIQUES;
OXIDE FORMATION;
OXYGEN ADSORPTION;
PHOTO-THERMAL;
PHOTOVOLTAIC;
PROCESSING PARAMETERS;
PROCESSING TECHNIQUE;
SILICON FILMS;
SILICON NANOPARTICLES;
SILICON SUBSTRATES;
SURFACE LAYERS;
SURFACE OXIDATIONS;
SURFACE OXIDE LAYER;
THERMOELECTRIC APPLICATION;
WRITING SPEED;
ATMOSPHERIC PRESSURE;
GAS ADSORPTION;
LASER OPTICS;
METALLIC FILMS;
MORPHOLOGY;
OXIDE FILMS;
SILICON;
|
EID: 84858865853
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s00339-012-6779-8 Document Type: Article |
Times cited : (12)
|
References (29)
|