Effect of a temperature gradient on ellipsometry measurements in supercritical CO 2

Journal of Supercritical Fluids

Volumn 64, Issue , 2012, Pages 25-31

  Mendoza Galvan A ^a   Trejo Cruz, C ^a,b   Solis Canto O ^a,c   Luna Barcenas G ^a  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b UNIVERSITY OF CONCEPCIÓN   (Chile)

^c CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

Anomalous swelling; Mirage effect; Mueller matrix ellipsometry; Supercritical CO 2

Indexed keywords

ANGLE OF INCIDENCE; CRITICAL POINTS; DENSITY FLUCTUATION; ELLIPSOMETRY MEASUREMENTS; EQUATION OF STATE; MIRAGE EFFECT; MIRAGE EFFECTS; MUELLER MATRIX; MUELLER MATRIX ELLIPSOMETRY; PHASE MODULATED SPECTROSCOPIC ELLIPSOMETRY; PMMA THIN FILM; SILICON SUBSTRATES; SUPERCRITICAL CO; SYSTEMATIC ANALYSIS;

ADSORPTION; ATMOSPHERIC PRESSURE; ELLIPSOMETRY; REFRACTIVE INDEX; SILICON COMPOUNDS; THERMAL GRADIENTS;

CARBON DIOXIDE;

EID: 84858782329     PISSN: 08968446     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.supflu.2012.02.002     Document Type: Article

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