|
Volumn 5, Issue 5, 2008, Pages 1219-1222
|
Condensation and cleaning of an organometallic copper compound to/from porous low-dielectric constant thin films in supercritical carbon dioxide
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ADSORPTION/DESORPTION;
ELLIPSOMETRIC MEASUREMENTS;
HIGH-PERFORMANCE INTEGRATED CIRCUITS;
IN-SITU;
IN-SITU ELLIPSOMETRY;
KEY TECHNOLOGIES;
LOW DIELECTRIC CONSTANTS;
ORGANOMETALLIC COMPOUNDS;
ORGANOSILICAS;
SUPERCRITICAL CARBON DIOXIDES;
BUILDING MATERIALS;
CARBON DIOXIDE;
CARBON FILMS;
COPPER;
COPPER COMPOUNDS;
EFFLUENT TREATMENT;
ORGANOMETALLICS;
SORPTION;
SPECTROSCOPIC ELLIPSOMETRY;
SUPERCRITICAL FLUIDS;
THIN FILMS;
SUPERCRITICAL FLUID EXTRACTION;
|
EID: 77951140203
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200777844 Document Type: Conference Paper |
Times cited : (10)
|
References (7)
|