A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

Beilstein Journal of Nanotechnology

Volumn 3, Issue 1, 2012, Pages 207-212

  Lange, Manfred ^a   van Vörden, Dennis ^a   Möller, Rolf ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

3; Atomic force microscopy; Energy dissipation; Force spectroscopy; Hysteresis loop; PTCDA Ag Si(111) 3

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); ATOMIC FORCE MICROSCOPIES (AFM); DIRECT MEASUREMENT; DISTANCE RANGES; FORCE GRADIENTS; FORCE SPECTROSCOPY; FORCE-DISTANCE CURVES; FREQUENCY SHIFT; HYSTERESIS EFFECT; MAXIMUM VALUES; NONCONSERVATIVE FORCES; NONCONTACT ATOMIC FORCE MICROSCOPY; OSCILLATION AMPLITUDE; TIP APEX; TUNING-FORK;

ATOMIC FORCE MICROSCOPY; ENERGY DISSIPATION; HYSTERESIS; MOLECULES; QUANTUM CHEMISTRY;

HYSTERESIS LOOPS;

EID: 84858411831     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.3.23     Document Type: Article

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