Calibration of the scanning Kelvin probe force microscope under controlled environmental conditions

Electrochimica Acta

Volumn 66, Issue , 2012, Pages 100-105

  Cook, A B ^a   Barrett, Z ^b   Lyon, S B ^a   McMurray, H N ^b   Walton, J ^a   Williams, G ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Corrosion potential; Kelvin probe; SKPFM; SKPFM Calibration; Volta potential difference

Indexed keywords

AFM TIP; CONTROLLED CONDITIONS; CORROSION POTENTIALS; ELECTROCHEMICAL POTENTIAL; ELECTROLYTE LAYERS; ENVIRONMENTAL CONDITIONS; EXPERIMENTAL ERRORS; GOOD CORRELATIONS; KELVIN PROBE; LINEAR CORRELATION; PURE METALS; REDOX COUPLE; SCANNING KELVIN PROBE FORCE MICROSCOPY; SCANNING KELVIN PROBES; SKPFM; VOLTA-POTENTIAL DIFFERENCE;

ATMOSPHERIC HUMIDITY; CALIBRATION; CORROSION; ELECTROLYTES; METAL IONS; PLATINUM; SCANNING; SODIUM CHLORIDE;

PROBES;

EID: 84857998150     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2012.01.054     Document Type: Article

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