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Volumn 56, Issue 4, 2011, Pages 1792-1798
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Scanning Kelvin probe force microscopy study of chromium nitrides in 2507 super duplex stainless steel - Implications and limitations
c
SWEREA KIMAB
(Sweden)
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Author keywords
Chromium nitrides; Critical pitting temperature; Duplex stainless steels; Scanning Kelvin probe force microscopy; Volta potential difference
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Indexed keywords
CHROMIUM NITRIDE;
CRITICAL PITTING TEMPERATURE;
DUPLEX STAINLESS STEEL;
SCANNING KELVIN PROBE FORCE MICROSCOPY;
VOLTA-POTENTIAL DIFFERENCE;
CHROMIUM;
CORROSION RESISTANCE;
CORROSION RESISTANT ALLOYS;
FERRITES;
NITRIDES;
PITTING;
PROBES;
SCANNING;
STAINLESS STEEL;
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EID: 79151473371
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2010.08.038 Document Type: Conference Paper |
Times cited : (79)
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References (39)
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