메뉴 건너뛰기




Volumn 56, Issue 4, 2011, Pages 1792-1798

Scanning Kelvin probe force microscopy study of chromium nitrides in 2507 super duplex stainless steel - Implications and limitations

Author keywords

Chromium nitrides; Critical pitting temperature; Duplex stainless steels; Scanning Kelvin probe force microscopy; Volta potential difference

Indexed keywords

CHROMIUM NITRIDE; CRITICAL PITTING TEMPERATURE; DUPLEX STAINLESS STEEL; SCANNING KELVIN PROBE FORCE MICROSCOPY; VOLTA-POTENTIAL DIFFERENCE;

EID: 79151473371     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2010.08.038     Document Type: Conference Paper
Times cited : (79)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.