Mechanical measurements of ultra-thin amorphous carbon membranes using scanning atomic force microscopy

Carbon

Volumn 50, Issue 6, 2012, Pages 2220-2225

  Suk, Ji Won ^a   Murali, Shanthi ^a   An, Jinho ^a   Ruoff, Rodney S ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPIES (AFM); CARBON ATOMS; CONTACT MODES; CONTACT-MODE AFM; ELECTRON BEAM EVAPORATION; MECHANICAL CHARACTERIZATIONS; MECHANICAL MEASUREMENTS; NORMAL LOADS; PERFORATED SUBSTRATES; PRE-STRESS; THICK MEMBRANES; TOPOGRAPHY IMAGES; ULTRA-THIN; ULTRA-THIN MEMBRANES; YOUNG'S MODULUS;

AMORPHOUS CARBON; ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; ELASTICITY; ELECTRON BEAMS; FINITE ELEMENT METHOD; MICA; RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBON FILMS;

EID: 84857918071     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2012.01.037     Document Type: Article

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