-
3
-
-
0344251916
-
-
A. Feldman, Y. Tzeng, W.A. Yarbrough, M. Yoshikawa, M. Murakawa (Eds.), NIST Special Publication 885, Gaithersburg, MD
-
M.A. Tamor, in: A. Feldman, Y. Tzeng, W.A. Yarbrough, M. Yoshikawa, M. Murakawa (Eds.), Application of Diamond Films and Related Material: Third International Conference, NIST Special Publication 885, Gaithersburg, MD, 1995, p. 691.
-
(1995)
Application of Diamond Films and Related Material: Third International Conference
, pp. 691
-
-
Tamor, M.A.1
-
4
-
-
0343709817
-
-
and references therein
-
See, for example, A. Joshi, S.A. Gangal, S.K. Kulkarni, J. Appl. Phys. 64 (1988) 6668, and references therein.
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 6668
-
-
Joshi, A.1
Gangal, S.A.2
Kulkarni, S.K.3
-
8
-
-
0030107408
-
-
F. Gaspari, R.V. Kruzelecky, P.K. Lim, L.S. Sidhu, S. Zukotynski, J. Appl. Phys. 79 (1996) 2684.
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 2684
-
-
Gaspari, F.1
Kruzelecky, R.V.2
Lim, P.K.3
Sidhu, L.S.4
Zukotynski, S.5
-
9
-
-
0032375163
-
-
W.C.W. Chan, F. Gaspari, T. Allen, P.K. Lim, E. Moreno, E. Sagnes, D. Manage, J. Szurmak, S. Zukotynski, J. Vac. Sci. Technol. A 16 (1998) 889.
-
(1998)
J. Vac. Sci. Technol. A
, vol.16
, pp. 889
-
-
Chan, W.C.W.1
Gaspari, F.2
Allen, T.3
Lim, P.K.4
Moreno, E.5
Sagnes, E.6
Manage, D.7
Szurmak, J.8
Zukotynski, S.9
-
10
-
-
0003404099
-
-
R.F. Davis (Ed.), ch. 6, Noyes, NJ
-
W. Zhu, H.S. Kong, J.T. Glass, in: R.F. Davis (Ed.), Diamond Films and Coatings, ch. 6, Noyes, NJ, 1993.
-
(1993)
Diamond Films and Coatings
-
-
Zhu, W.1
Kong, H.S.2
Glass, J.T.3
-
11
-
-
0003459529
-
-
J. Chastain (Ed.), Perkin-Elmer Corporation, USA
-
J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, in: J. Chastain (Ed.), Handbook of X-ray Photoelectron Spectroscopy: a reference book of standard spectra for identification and interpretation of XPS data, Perkin-Elmer Corporation, USA, 1992.
-
(1992)
Handbook of X-ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
-
12
-
-
0000144737
-
-
D. Briggs, M.P. Seah (Eds.), ch. 3, Wiley, Great Britain
-
D. Briggs, J.C. Rivière, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, vol. 1, ch. 3, Wiley, Great Britain, 1990.
-
(1990)
Practical Surface Analysis
, vol.1
-
-
Briggs, D.1
Rivière, J.C.2
-
14
-
-
0037798014
-
-
J. Díaz, G. Paolicelli, S. Ferrer, F. Comin, Phys. Rev. B 54 (1996) 8064.
-
(1996)
Phys. Rev. B
, vol.54
, pp. 8064
-
-
Díaz, J.1
Paolicelli, G.2
Ferrer, S.3
Comin, F.4
-
16
-
-
85031627275
-
-
MPhil thesis, Department of Physics, Hong Kong Baptist University
-
T.Y. Leung, MPhil thesis, Department of Physics, Hong Kong Baptist University, 1998.
-
(1998)
-
-
Leung, T.Y.1
-
17
-
-
0041740620
-
-
J.J. Cuomo, J.P. Doyle, J. Bruley, J.C. Liu, Appl. Phys. Lett. 58 (1991) 466.
-
(1991)
Appl. Phys. Lett.
, vol.58
, pp. 466
-
-
Cuomo, J.J.1
Doyle, J.P.2
Bruley, J.3
Liu, J.C.4
-
18
-
-
0005989267
-
-
A. Schenk, B. Winter, C. Lutterloh, J. Biener, U.A. Schubert, J. Küppers, J. Appl. Phys. 77 (1995) 6006.
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 6006
-
-
Schenk, A.1
Winter, B.2
Lutterloh, C.3
Biener, J.4
Schubert, U.A.5
Küppers, J.6
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