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Nanoscale

Volumn 4, Issue 6, 2012, Pages 2005-2009

Identification of structural defects in graphitic materials by gas-phase anisotropic etching

(4) Wu, Shuang a Yang, Rong a Shi, Dongxia a Zhang, Guangyu a

a INSTITUTE OF PHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC ETCHING; DEFECT DENSITY; DEFECTS; GRAPHENE; GRAPHITE;

ARTIFICIAL DEFECTS; CRYSTAL QUALITIES; DEFECT TYPE; DOMAIN SIZE; GASPHASE; GRAIN SIZE; GRAPHITIC MATERIALS; HIGHLY ORIENTED PYROLYTIC GRAPHITE; KISH GRAPHITE; LATTICE ORIENTATIONS; PLASMA-INDUCED; STRUCTURAL DEFECT;

ARGON;

GRAPHITE; NANOMATERIAL;

ANISOTROPY; ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; HEAT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTY; ULTRASTRUCTURE;

ANISOTROPY; CRYSTALLIZATION; GRAPHITE; HOT TEMPERATURE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTIES;

EID: 84857818729 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c2nr11707j Document Type: Article

Times cited : (40)

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