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Volumn 85, Issue 8, 2012, Pages

Role of applied bias and tip electronic structure in the scanning tunneling microscopy imaging of highly oriented pyrolytic graphite

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EID: 84857757280     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.085433     Document Type: Article
Times cited : (19)

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