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Volumn 348, Issue 1-3, 2008, Pages 233-236
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A new interpretation of the scanning tunneling microscope image of graphite
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Author keywords
DFT; Graphene; Graphite; HOPG; Scanning tunneling microscopy (STM); Tip artifacts
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Indexed keywords
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EID: 43849111715
PISSN: 03010104
EISSN: None
Source Type: Journal
DOI: 10.1016/j.chemphys.2008.03.019 Document Type: Article |
Times cited : (20)
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References (32)
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