Eu3+ reduction and efficient light emission in Eu 2O3 films deposited on Si substrates

Optics Express

Volumn 20, Issue 5, 2012, Pages 5501-5507

  Bellocchi, Gabriele ^a,b   Franzò, Giorgia ^a   Iacona, Fabio ^a   Boninelli, Simona ^a   Miritello, Maria ^a   Cesca, Tiziana ^c   Priolo, Francesco ^a,b  

^a CNR IMM   (Italy)

^b UNIVERSITY OF CATANIA   (Italy)

^c UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

SILICA; SILICATES; SILICON; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ANNEALED FILMS; EXTERNAL QUANTUM EFFICIENCY; N2 AMBIENT; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SI SUBSTRATES; THERMAL-ANNEALING; X-RAY DIFFRACTION MEASUREMENTS;

EUROPIUM;

EUROPIUM; OXIDE; SILICON;

ADSORPTION; ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; LIGHT; MATERIALS TESTING; RADIATION SCATTERING; REFRACTOMETRY;

ADSORPTION; EUROPIUM; LIGHT; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; OXIDES; REFRACTOMETRY; SCATTERING, RADIATION; SILICON;

EID: 84857579809     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.005501     Document Type: Article

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