Blue and red electroluminescence of Europium-implanted metal-oxide- semiconductor structures as a probe for the dynamics of microstructure

Applied Physics Letters

Volumn 93, Issue 7, 2008, Pages

  Rebohle, L ^a   Lehmann, J ^a   Prucnal, S ^a   Kanjilal, A ^a   Nazarov, A ^a,b   Tyagulskii, I ^a,b   Skorupa, W ^a   Helm, M ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; ELECTROLUMINESCENCE; EUROPIUM; LIGHT; LIGHT EMISSION; LUMINESCENCE; METALS; MICROCRYSTALLINE SILICON; MICROSTRUCTURE; NONMETALS; OXYGEN; OXYGEN SUPPLY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR GROWTH; SILICON;

ACTIVE LAYERS; ANNEALING CONDITIONS; ANNEALING TEMPERATURES; ANNEALING TIMES; ELECTROLUMINESCENCE SPECTRA; EU3+ IONS; EUROPIUM OXIDES; METAL-OXIDE SEMICONDUCTORS; MICROSTRUCTURAL DEVELOPMENTS; QUANTITATIVE ANALYSIS; RED ELECTROLUMINESCENCE; TRANSMISSION ELECTRON;

ANNEALING;

EID: 50249100222     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2964176     Document Type: Article

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