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Volumn 18, Issue 26, 2010, Pages 27191-27196

Structure and luminescence evolution of annealed Europium-doped silicon oxides films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON BEAMS; EUROPIUM; LUMINESCENCE; SILICATES; SILICON OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 78650531409     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.027191     Document Type: Article
Times cited : (49)

References (21)
  • 2
    • 13144305112 scopus 로고    scopus 로고
    • Field-effect electroluminescence in silicon nanocrystals
    • R. J. Walters, G. I. Bourianoff, and H. A. Atwater, "Field-effect electroluminescence in silicon nanocrystals," Nat. Mater. 4(2), 143-146 (2005).
    • (2005) Nat. Mater. , vol.4 , Issue.2 , pp. 143-146
    • Walters, R.J.1    Bourianoff, G.I.2    Atwater, H.A.3
  • 3
    • 10844279043 scopus 로고    scopus 로고
    • Light emission from Si quantum dots
    • P. M. Fauchet, "Light emission from Si quantum dots," Mater. Today 8(1), 26-33 (2005).
    • (2005) Mater. Today , vol.8 , Issue.1 , pp. 26-33
    • Fauchet, P.M.1
  • 4
    • 34249889061 scopus 로고    scopus 로고
    • Correlation between luminescence and structural evolution of Si-rich silicon oxide film annealed at different temperatures
    • M. Wang, D. Yang, D. Li, Z. Yuan, and D. Que, "Correlation between luminescence and structural evolution of Si-rich silicon oxide film annealed at different temperatures," J. Appl. Phys. 101(10), 103504 (2007).
    • (2007) J. Appl. Phys. , vol.101 , Issue.10 , pp. 103504
    • Wang, M.1    Yang, D.2    Li, D.3    Yuan, Z.4    Que, D.5
  • 5
    • 77951994178 scopus 로고    scopus 로고
    • Structure and luminescence of rare earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence
    • T. Roschuk, P. R. J. Wilson, J. Li, O. H. Y. Zalloum, J. Wojcik, and P. Mascher, "Structure and luminescence of rare earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence," Phys. Status Solidi B 247(2), 248-253 (2010).
    • (2010) Phys. Status Solidi B , vol.247 , Issue.2 , pp. 248-253
    • Roschuk, T.1    Wilson, P.R.J.2    Li, J.3    Zalloum, O.H.Y.4    Wojcik, J.5    Mascher, P.6
  • 9
    • 58149528207 scopus 로고    scopus 로고
    • The formation of light emitting cerium silicates in cerium-doped silicon oxides
    • J. Li, O. Zalloum, T. Roschuk, C. Heng, J. Wojcik, and P. Mascher, "The formation of light emitting cerium silicates in cerium-doped silicon oxides," Appl. Phys. Lett. 94(1), 011112 (2009).
    • (2009) Appl. Phys. Lett. , vol.94 , Issue.1 , pp. 011112
    • Li, J.1    Zalloum, O.2    Roschuk, T.3    Heng, C.4    Wojcik, J.5    Mascher, P.6
  • 10
    • 34247894038 scopus 로고    scopus 로고
    • Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu
    • S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, "Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu," Appl. Phys. Lett. 90(18), 181121 (2007).
    • (2007) Appl. Phys. Lett. , vol.90 , Issue.18 , pp. 181121
    • Prucnal, S.1    Sun, J.M.2    Skorupa, W.3    Helm, M.4
  • 11
    • 50249100222 scopus 로고    scopus 로고
    • Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure
    • L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskiib, W. Skorupa, and M. Helm, "Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure," Appl. Phys. Lett. 93(7), 071908 (2008).
    • (2008) Appl. Phys. Lett. , vol.93 , Issue.7 , pp. 071908
    • Rebohle, L.1    Lehmann, J.2    Prucnal, S.3    Kanjilal, A.4    Nazarov, A.5    Tyagulskiib, I.6    Skorupa, W.7    Helm, M.8
  • 14
    • 0034250221 scopus 로고    scopus 로고
    • Europium silicate thin films on Si substrates fabricated by a radio frequency sputtering method
    • J. F. Qi, T. Matsumoto, M. Tanaka, and Y. Masumoto, "Europium silicate thin films on Si substrates fabricated by a radio frequency sputtering method," J. Phys. D Appl. Phys. 33(16), 2074-2078 (2000).
    • (2000) J. Phys. D Appl. Phys. , vol.33 , Issue.16 , pp. 2074-2078
    • Qi, J.F.1    Matsumoto, T.2    Tanaka, M.3    Masumoto, Y.4
  • 16
    • 70349774373 scopus 로고    scopus 로고
    • Intense red and cyan luminescence in europium doped silicate glasses
    • T. Cao, G. Chen, W. Lu, H. Zhou, J. Li, Z. Zhu, Z. You, Y. Wang, and C. Tu, "Intense red and cyan luminescence in europium doped silicate glasses," J. Non-Cryst. Solids 355(48-49), 2361-2364 (2009).
    • (2009) J. Non-Cryst. Solids , vol.355 , Issue.48-49 , pp. 2361-2364
    • Cao, T.1    Chen, G.2    Lu, W.3    Zhou, H.4    Li, J.5    Zhu, Z.6    You, Z.7    Wang, Y.8    Tu, C.9
  • 17
    • 0025839940 scopus 로고
    • Doubly-valent rare-earth ions in halide crystals
    • J. Rubio., "Doubly-valent rare-earth ions in halide crystals," J. Phys. Chem. Solids 52(1), 101-174 (1991).
    • (1991) J. Phys. Chem. Solids , vol.52 , Issue.1 , pp. 101-174
    • Rubio, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.