Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials

Current Opinion in Colloid and Interface Science

Volumn 17, Issue 1, 2012, Pages 44-53

  Kirby, B J ^a   Kienzle, P A ^a   Maranville, B B ^a   Berk, N F ^a   Krycka, J ^a   Heinrich, F ^b   Majkrzak, C F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Composition depth profile; Multilayers; Neutron; Phase sensitive; Reflectivity; Thin films

Indexed keywords

COMPOSITION DEPTH PROFILES; CROSS-SECTIONAL DISTRIBUTION; IMAGING DEVICE; MOLECULAR SCALE STRUCTURES; NANO-METER SCALE; NEUTRON REFLECTOMETRY; PHASE-SENSITIVE; PHASE-SENSITIVE METHODS; REFLECTIVITY DATA; SOFT CONDENSED MATTERS; SOFT MATTER; SPATIAL RESOLUTION; STATISTICAL UNCERTAINTY; THIN FILM MATERIAL; THIN FILM SYSTEMS;

FILM PREPARATION; MULTILAYERS; NEUTRON REFLECTION; NEUTRONS; REFLECTION; THIN FILMS;

NEUTRON DIFFRACTION;

ALUMINUM OXIDE; PHOSPHOLIPID; POLYELECTROLYTE;

BIOCOMPATIBILITY; BIOMIMETICS; CELL MEMBRANE; DENSITY; FILM; LIPID BILAYER; LIPID MEMBRANE; PHASE SENSITIVE NEUTRON REFLECTOMETRY; PHOSPHOLIPID BILAYER; POLYMERIZATION; REFLECTOMETRY; REVIEW; SCATTERING LENGTH DENSITY;

EID: 84856805434     PISSN: 13590294     EISSN: 18790399     Source Type: Journal    
DOI: 10.1016/j.cocis.2011.11.001     Document Type: Review

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