Neutron and X-ray reflectometry of interfacial systems in colloid and polymer chemistry

Current Opinion in Colloid and Interface Science

Volumn 1, Issue 1, 1996, Pages 23-33

  Thomas, Robert K ^a   Penfold, Jeff ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE INTERFACES; POLYMER FILMS; REFLECTION; REFLECTOMETERS; SOLS; SURFACE ACTIVE AGENTS; X RAYS;

INSOLUBLE MONOLAYER; INTERFACIAL SYSTEMS; POLYMER CHEMISTRY; POLYMER THIN FILMS; SOLID/LIQUID INTERFACES; SURFACTANT MIXTURE; X-RAY REFLECTOMETRY; X-RAY SPECULAR REFLECTOMETRY;

COLLOID CHEMISTRY;

EID: 0002329258     PISSN: 13590294     EISSN: 18790399     Source Type: Journal    
DOI: 10.1016/S1359-0294(96)80040-9     Document Type: Article

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