Composition profiling in a binary polymer blend thin film using polarized neutron reflectivity

Europhysics Letters

Volumn 50, Issue 1, 2000, Pages 107-112

  Grull H ^a,c   Schreyer, A ^a,b   Berk, N F ^a   Majkhzak, C F ^a   Han, C C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b RUHR UNIVERSITY BOCHUM   (Germany)

^c BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034164130     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2000-00242-8     Document Type: Article

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