Phase sensitive reflectometry and the unambiguous determination of scattering length density profiles

Physica B: Condensed Matter

Volumn 336, Issue 1-2, 2003, Pages 27-38

  Majkrzak, C F ^a   Berk, N F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Neutrons; Phase; Reflectivity; Thin film; X ray

Indexed keywords

COMPUTATIONAL METHODS; REFLECTOMETERS; SCATTERING; THIN FILMS; X RAY ANALYSIS;

PHASE SENSITIVE REFLECTOMETRY;

NEUTRON REFLECTION;

EID: 0037668987     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(03)00266-7     Document Type: Conference Paper

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