Measurement of finite-frequency current statistics in a single-electron transistor

Nature Communications

Volumn 3, Issue , 2012, Pages

  Ubbelohde, Niels ^a   Fricke, Christian ^a   Flindt, Christian ^b,c   Hohls, Frank ^a,d   Haug, Rolf J ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b UNIVERSITY OF GENEVA   (Switzerland)

^c HARVARD UNIVERSITY   (United States)

^d PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLE;

ARTICLE; ELECTRIC POTENTIAL; ELECTRICAL PARAMETERS; ELECTRON TRANSPORT; FREQUENCY MODULATION; NOISE MEASUREMENT; PROCESS MODEL; QUANTUM MECHANICS; SEMICONDUCTOR;

EID: 84856711992     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms1620     Document Type: Article

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