Real-time detection of single-electron tunneling using a quantum point contact

Applied Physics Letters

Volumn 85, Issue 19, 2004, Pages 4394-4396

  Vandersypen, L M K ^a   Elzerman, J M ^a   Schouten, R N ^a   Van Beveren, L H Willems ^a   Hanson, R ^a   Kouwenhoven, L P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONVERTERS; ELECTRIC POTENTIAL; ELECTRON GAS; FIELD EFFECT TRANSISTORS; POINT CONTACTS; QUANTUM THEORY; SEMICONDUCTOR QUANTUM DOTS; TWO DIMENSIONAL;

JUNCTION FIELD EFFECT TRANSISTORS (JFET); QUANTUM POINT CONTACTS (QPC); SINGLE-ELECTRON TUNNELING; TWO DIMENSIONAL ELECTRON GAS (2DEG);

ELECTRON TUNNELING;

EID: 10844292542     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1815041     Document Type: Conference Paper

References (14)

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