Environmental effects in the third moment of voltage fluctuations in a tunnel junction

Physical Review Letters

Volumn 91, Issue 19, 2003, Pages

  Reulet, B ^a,b   Senzier, J ^a   Prober, D E ^a  

^a YALE UNIVERSITY   (United States)

^b CNRS Laboratoire de Physique de Solides   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTRIC CONDUCTORS; ELECTRIC IMPEDANCE; ELECTROMAGNETIC FIELD EFFECTS; ELECTRON TRANSPORT PROPERTIES; MAGNETIC MOMENTS; NUMERICAL METHODS; SPURIOUS SIGNAL NOISE; TEMPERATURE; THRESHOLD VOLTAGE; VOLTAGE MEASUREMENT;

NONSUPERCONDUCTING TUNNEL JUNCTIONS; VOLTAGE BIAS; VOLTAGE FLUCTUATIONS;

TUNNEL JUNCTIONS;

EID: 0348107267     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.91.196601     Document Type: Article

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