Wavelet analysis for single molecule localization microscopy

Optics Express

Volumn 20, Issue 3, 2012, Pages 2081-2095

  Izeddin, I ^a   Boulanger, J ^b   Racine, V ^b   Specht, C G ^c   Kechkar, A ^d,e   Nair, D ^d,e   Triller, A ^c   Choquet, D ^d,e   Dahan, M ^a   Sibarita, J B ^d,e  

^a LABORATOIRE KASTLER BROSSEL   (France)

^b INSTITUT CURIE   (France)

^c ECOLE NORMALE SUPÉRIEURE   (France)

^d CNRS   (France)

^e UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE SEGMENTATION; OPTICAL MICROSCOPY; OPTICAL TRANSFER FUNCTION; SIGNAL TO NOISE RATIO; WAVELET ANALYSIS;

CALCULATION TIME; GAUSSIAN FITTING; LARGE DATASETS; LOCALIZATION ACCURACY; MICROSCOPY IMAGES; MICROSCOPY TECHNIQUE; PARTICLE DENSITIES; REALISTIC SIMULATION; SIGNAL TO NOISE; SIMULATION-BASED; SINGLE IMAGES; SINGLE MOLECULE; SINGLE PARTICLE; SINGLE-MOLECULE DETECTION; SUPER RESOLUTION;

MOLECULES;

NANOPARTICLE;

ARTICLE; COMPUTER ASSISTED DIAGNOSIS; METHODOLOGY; MICROSCOPY; MOLECULAR IMAGING; ULTRASTRUCTURE; WAVELET ANALYSIS;

IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; MOLECULAR IMAGING; NANOPARTICLES; WAVELET ANALYSIS;

EID: 84856420534     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.002081     Document Type: Article

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