Measuring localization performance of super-resolution algorithms on very active samples

Optics Express

Volumn 19, Issue 8, 2011, Pages 7020-7033

  Wolter, Steve ^a   Endesfelder, Ulrike ^a,b   Van De Linde, Sebastian ^a   Heilemann, Mike ^a,b   Sauer, Markus ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b BIELEFELD UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; MICROMETERS; OPTICAL RESOLVING POWER;

ANALYTIC TOOLS; COMPUTATIONAL PRECISION; FLUORESCENCE IMAGING; FLUOROPHORE EMISSION; HIGH DENSITY; LOCALIZATION PERFORMANCE; MULTIPLE CURRENTS; PROCESSING ALGORITHMS; SINGLE-MOLECULE; SUPER RESOLUTION; SUPER RESOLUTION ALGORITHMS; TIME-RESOLVED;

FLUOROPHORES;

FLUORESCENT DYE;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER PROGRAM; FLUORESCENCE MICROSCOPY; IMAGE PROCESSING; METHODOLOGY; NORMAL DISTRIBUTION; POISSON DISTRIBUTION; PROBABILITY; STATISTICS; TIME;

ALGORITHMS; FLUORESCENT DYES; IMAGE PROCESSING, COMPUTER-ASSISTED; MARKOV CHAINS; MICROSCOPY, FLUORESCENCE; NORMAL DISTRIBUTION; POISSON DISTRIBUTION; SOFTWARE; STOCHASTIC PROCESSES; TIME FACTORS;

EID: 79953864779     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.007020     Document Type: Article

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