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Volumn 51, Issue 3, 2012, Pages 385-389

Optimizing the identification of mono- and bilayer graphene on multilayer substrates

Author keywords

[No Author keywords available]

Indexed keywords

GENETIC ALGORITHMS; GRAPHENE; MULTILAYERS;

EID: 84856272712     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.51.000385     Document Type: Article
Times cited : (8)

References (23)
  • 2
    • 33746764451 scopus 로고    scopus 로고
    • From graphene to graphite: Electronic structure around the K-point
    • B. Partoens and F. M. Peeters, "From graphene to graphite: electronic structure around the K-point," Phys. Rev. B 74, 075404 (2006).
    • (2006) Phys. Rev. B , vol.74 , pp. 075404
    • Partoens, B.1    Peeters, F.M.2
  • 5
    • 42549089580 scopus 로고    scopus 로고
    • Epitaxial graphene on ruthenium
    • DOI 10.1038/nmat2166, PII NMAT2166
    • P. W. Sutter, J.-I. Flege, and E. A. Sutter, "Epitaxial graphene on ruthenium," Nature Materials 7, 406-411 (2008). (Pubitemid 351585230)
    • (2008) Nature Materials , vol.7 , Issue.5 , pp. 406-411
    • Sutter, P.W.1    Flege, J.-I.2    Sutter, E.A.3
  • 8
    • 57249092731 scopus 로고    scopus 로고
    • Transferring and identification of single- and few-layer graphene on arbitrary substrates
    • A. Reina, H. Son, K. Jiao, B. Fan, M. S. Dresselhaus, Z. Liu, and J. Kong, "Transferring and identification of single- and few-layer graphene on arbitrary substrates," J. Phys. Chem. Lett. 112, 17741-17744 (2008).
    • (2008) J. Phys. Chem. Lett. , vol.112 , pp. 17741-17744
    • Reina, A.1    Son, H.2    Jiao, K.3    Fan, B.4    Dresselhaus, M.S.5    Liu, Z.6    Kong, J.7
  • 10
    • 51849098256 scopus 로고    scopus 로고
    • Total color difference for rapid and accurate identification of graphene
    • L. Gao, W. Ren, F. Li, and H. Cheng, "Total color difference for rapid and accurate identification of graphene," ACS Nano 2, 1625-1633 (2008).
    • (2008) ACS Nano , vol.2 , pp. 1625-1633
    • Gao, L.1    Ren, W.2    Li, F.3    Cheng, H.4
  • 12
    • 70249132152 scopus 로고    scopus 로고
    • Graphene on gallium arsenide: Engineering the visibility
    • M. Friedemann, K. Pierz, R. Stosch, and F. J. Ahlers, "Graphene on gallium arsenide: engineering the visibility," Appl. Phys. Lett. 95, 102103 (2009).
    • (2009) Appl. Phys. Lett. , vol.95 , pp. 102103
    • Friedemann, M.1    Pierz, K.2    Stosch, R.3    Ahlers, F.J.4
  • 13
    • 34547842542 scopus 로고    scopus 로고
    • Visibility of graphene flakes on a dielectric substrate
    • D. S. L. Abergel, A. Russell, and V. I. Fal'ko, "Visibility of graphene flakes on a dielectric substrate," Appl. Phys. Lett. 91, 063125 (2007).
    • (2007) Appl. Phys. Lett. , Issue.91 , pp. 063125
    • Abergel, D.S.L.1    Russell, A.2    Fal'ko, V.I.3
  • 14
    • 70249139880 scopus 로고    scopus 로고
    • Assessment of graphene quality by quantitative optical contrast analysis
    • M. Bruna and S. Borini, "Assessment of graphene quality by quantitative optical contrast analysis," J. Phys. D 42, 175307 (2009).
    • (2009) J. Phys. D , vol.42 , pp. 175307
    • Bruna, M.1    Borini, S.2
  • 16
    • 34948892768 scopus 로고    scopus 로고
    • Graphene thickness determination using reflection and contrast spectroscopy
    • DOI 10.1021/nl071254m
    • Z. H. Ni, H. M. Wang, J. Kasmin, H. M. Fan, T. Yu, Y. H. Wu, Y. P. Feng, and Z. X. Shen, "Graphene thickness determination using reflection and contrast spectroscopy," Nano Lett. 7, 2758-2763 (2007). (Pubitemid 47522434)
    • (2007) Nano Letters , vol.7 , Issue.9 , pp. 2758-2763
    • Ni, Z.H.1    Wang, H.M.2    Kasim, J.3    Fan, H.M.4    Yu, T.5    Wu, Y.H.6    Feng, Y.P.7    Shen, Z.X.8
  • 18
    • 77956356344 scopus 로고    scopus 로고
    • Optical constants of graphene measured by spectroscopic ellipsometry
    • J. W. Weber, V. E. Calado, and M. C. M. van de Sanden, "Optical constants of graphene measured by spectroscopic ellipsometry," Appl. Phys. Lett. 97, 091904 (2010).
    • (2010) Appl. Phys. Lett. , vol.97 , pp. 091904
    • Weber, J.W.1    Calado, V.E.2    Van De Sanden, M.C.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.