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Volumn 6, Issue 3, 2004, Pages
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Measuring three-dimensional polarization with scanning optical probes
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Author keywords
Electromagnetic optics; Phase measurement; Polarization measurement; Scanning optical probe microscopy; Sub wavelength features
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Indexed keywords
ELECTROMAGNETIC OPTICS;
POLARIZATION MEASUREMENT;
SCANNING OPTICAL PROBE MICROSCOPY;
SUB-WAVELENGTH FEATURES;
COMPUTATIONAL METHODS;
ELECTRIC FIELDS;
ELECTROMAGNETIC WAVE DIFFRACTION;
ELECTROMAGNETISM;
HETERODYNING;
MICROSCOPIC EXAMINATION;
MICROSTRUCTURE;
OPTICAL FIBERS;
PHASE MEASUREMENT;
SCANNING;
LIGHT POLARIZATION;
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EID: 1642618950
PISSN: 14644258
EISSN: None
Source Type: Journal
DOI: 10.1088/1464-4258/6/3/003 Document Type: Conference Paper |
Times cited : (27)
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References (9)
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