Dislocation density measurement by electron channeling contrast imaging in a scanning electron microscope

Scripta Materialia

Volumn 66, Issue 6, 2012, Pages 343-346

  Gutierrez Urrutia, I ^a   Raabe, D ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

Dislocations; Electron diffraction; Ferritic steels; Low temperature deformation; Scanning electron microscopy (SEM)

Indexed keywords

BRIGHT FIELD TRANSMISSION ELECTRON MICROSCOPY; BULK METALS; DISLOCATION DENSITIES; ELECTRON CHANNELING CONTRASTS; LOW TEMPERATURE DEFORMATIONS; MACROSCOPIC STRESS; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS; SI ALLOYS;

DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; FERRITIC STEEL; SCANNING ELECTRON MICROSCOPY; SILICON ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

EID: 84855892091     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2011.11.027     Document Type: Article

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