SCOPUS 정보 검색 플랫폼

Volumn 22, Issue , 2012, Pages 105-112

Improving diamond coating on Ti6Al4V substrate using a diamond like carbon interlayer: Raman residual stress evaluation and AFM analyses

(7) Nibennanoune, Z a,b George, D a Antoni, F a Ahzi, S a,c Ruch, D b Gracio, J c Remond, Y a

a UNIVERSITÉ DE STRASBOURG (France)

b LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (Luxembourg)

c UNIVERSITY OF AVEIRO (Portugal)

Author keywords

AFM; Diamond thin film; DLC; Raman spectroscopy; Residual stresses; Ti6Al4V

Indexed keywords

AFM; DIAMOND COATING; DIAMOND LIKE CARBON; DIAMOND THIN FILM; DLC; MICRO RAMAN SPECTROSCOPY; NUCLEATION SITES; SEEDING PROCESS; STRESS EVALUATIONS; STRESS INTENSITY; SURFACE FINISHES; TI-6AL-4V;

COATINGS; DIAMOND CUTTING TOOLS; DIAMOND FILMS; GRAIN GROWTH; RAMAN SCATTERING; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; SUBSTRATES; SURFACE ROUGHNESS;

QUALITY CONTROL;

EID: 84855890820 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/j.diamond.2011.12.023 Document Type: Article

Times cited : (34)

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