Exact evaluation of diagnostic test resolution

Proceedings - Design Automation Conference

Volumn , Issue , 1992, Pages 347-352

  Kubiak, Ken ^a   Parkes, Steven ^a   Fuchs, W Kent ^a   Saleh, Resve ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BOOLEAN FUNCTIONS; EQUIVALENCE CLASSES; SEQUENTIAL CIRCUITS;

SINGLE STUCK AT FAULTS; SYMBOLIC ALGORITHMS;

COMBINATORIAL CIRCUITS;

EID: 0026971356     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)