Electron tomography of nanostructured materials - Towards a quantitative 3D analysis with nanometer resolution

Materials Science Forum

Volumn 638-642, Issue , 2010, Pages 2517-2522

  Kübel, Christian ^a,b   Niemeyer, Dirk ^c   Cieslinski, Robert ^d   Rozeveld, Steve ^d  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b FRAUNHOFER INSTITUTE FOR MANUFACTURING TECHNOLOGY AND ADVANCED MATERIALS IFAM   (Germany)

^c SASOL Germany GmbH   (Germany)

^d DOW CHEMICAL COMPANY   (United States)

Author keywords

3D quantification; Electron tomography; Nanostructured materials; STEM; TEM

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; STEM (SCIENCE, TECHNOLOGY, ENGINEERING AND MATHEMATICS); TRANSMISSION ELECTRON MICROSCOPY;

3D QUANTIFICATION; ELECTRON TOMOGRAPHY; HAADF STEM TOMOGRAPHIES; HETEROGENEOUS CATALYST; MACROSCOPIC MEASUREMENTS; NANOMETER RESOLUTIONS; QUANTITATIVE MEASUREMENT; SEGMENTATION PROCESS;

ELECTRONS;

EID: 75849156413     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.638-642.2517     Document Type: Conference Paper

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