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Volumn 47, Issue 3, 2012, Pages 1522-1530

Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy

(2) Szybowicz, M a Makowiecki, J a

a POZNAN UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING PROCESS; BEAM EVAPORATION; DIFFERENT THICKNESS; EXCITATION WAVELENGTH; INTERMEDIATE PHASE; IRON PHTHALOCYANINES; MICRO RAMAN SPECTROSCOPY; MICRO-RAMAN SCATTERING; ORGANIC THIN FILMS; POLARIZED RAMAN SPECTRA; POLYMORPHIC PHASIS; RAMAN MAPPING; ROOM TEMPERATURE; SILICON SUBSTRATES; SPECTRAL RANGE; THIN LAYERS;

ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CRYSTAL ATOMIC STRUCTURE; LITHOGRAPHY; MOLECULAR STRUCTURE; NITROGEN COMPOUNDS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES;

THIN FILMS;

EID: 84855484512 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-011-5940-7 Document Type: Article

Times cited : (47)

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