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Volumn 46, Issue 20, 2011, Pages 6589-6595
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The molecular structure ordering and orientation of the metallophthalocyanine CoPc, ZnPc, CuPc, and MgPc thin layers deposited on silicon substrate, as studied by micro-Raman spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING PROCESS;
BEAM EVAPORATION;
EXCITATION WAVELENGTH;
METALLOPHTHALOCYANINES;
MICRO RAMAN SPECTROSCOPY;
MICRO-RAMAN SCATTERING;
POLARIZED RAMAN SPECTRA;
POLYMORPHIC PHASIS;
RAMAN MAPPING;
RAMAN MODES;
ROOM TEMPERATURE;
SILICON SUBSTRATES;
SPECTRAL RANGE;
THIN LAYERS;
ANNEALING;
MOLECULAR ORIENTATION;
MOLECULAR STRUCTURE;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
THIN FILMS;
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EID: 80051549990
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-011-5607-4 Document Type: Article |
Times cited : (64)
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References (26)
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