High temperature study of FT-IR and Raman scattering spectra of vacuum deposited CuPc thin films

Journal of Molecular Structure

Volumn 704, Issue 1-3, 2004, Pages 107-113

  Szybowicz, M ^a   Runka, T ^a   Drozdowski, M ^a   Bala W ^b   Grodzicki, A ^b   Piszczek, P ^b   Bratkowski, A ^b  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b NICOLAUS COPERNICUS UNIVERSITY   (Poland)

Author keywords

71.70.FK; 78.55.Kz; 78.66.Qn; Copper phthalocyanine (CuPc); FT IR spectra; Raman spectra; Thin films

Indexed keywords

BOROSILICATE; COPPER COMPLEX; GLASS; PHTHALOCYANINE DERIVATIVE; POTASSIUM BROMIDE; SILICATE; SILICON DERIVATIVE; UNCLASSIFIED DRUG;

CALCULATION; CONDUCTANCE; CONFERENCE PAPER; FILM; INFRARED SPECTROSCOPY; MOLECULAR DYNAMICS; MOLECULAR PHYSICS; RAMAN SPECTROMETRY; TEMPERATURE SENSITIVITY;

EID: 4143065814     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molstruc.2004.01.053     Document Type: Conference Paper

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