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Volumn 11, Issue 4, 2000, Pages 331-346
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Studies on phase transformations of Cu-phthalocyanine thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPOSITION EFFECTS;
COPPER COMPOUNDS;
CRYSTAL ORIENTATION;
CRYSTALLIZATION;
MORPHOLOGY;
PHASE TRANSITIONS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
COPPER PHTHALOCYANINE;
SEMICONDUCTING FILMS;
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EID: 0034204585
PISSN: 09574522
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1008933516940 Document Type: Article |
Times cited : (136)
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References (53)
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