The Student's t distribution to measure the word error rate in analog-to-digital converters

Measurement: Journal of the International Measurement Confederation

Volumn 45, Issue 2, 2012, Pages 148-154

  Balestrieri, E ^a   Catelani, M ^b   Ciani, L ^b   Rapuano, S ^a   Zanobini, A ^b  

^a UNIVERSITY OF SANNIO   (Italy)

^b UNIVERSITY OF FLORENCE   (Italy)

Author keywords

ADC testing; Standards; Uncertainty; Word error rate

Indexed keywords

ADC TESTING; ANALOG TO DIGITAL CONVERTERS; IEEE STANDARDS; STANDARD METHOD; STATISTICAL APPROACH; STUDENT'S T DISTRIBUTION; TESTING RESULTS; UNCERTAINTY; WORD ERROR RATE;

STANDARDS;

ANALOG TO DIGITAL CONVERSION;

EID: 84655162302     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2011.03.002     Document Type: Article

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