Experimental comparison of different standards for dynamic characterization of ADCs

IEEE Transactions on Instrumentation and Measurement

Volumn 58, Issue 5, 2009, Pages 1307-1315

  Balestrieri, Eulalia ^a   Corrado, Marco ^a   Daponte, Pasquale ^a   Rapuano, Sergio ^a  

^a UNIVERSITY OF SANNIO   (Italy)

Author keywords

Analog digital converter (ADC); Effective number of bits (ENOB); IEC; Signal to noise ratio (SNR); SIgnal to Noise And Distortion ratio (SINAD); Spurious free dynamic range (SFDR); Standard; Total harmonic distortion (THD)

Indexed keywords

ANALOG TO DIGITAL CONVERSION; FREQUENCY CONVERTERS; FREQUENCY DOMAIN ANALYSIS; HARMONIC DISTORTION; IEEE STANDARDS; STANDARDS; TESTING; WAVE FILTERS;

ANALOG-DIGITAL CONVERTER; EFFECTIVE NUMBER OF BITS; SIGNAL TO NOISE AND DISTORTION RATIO; SPURIOUS FREE DYNAMIC RANGE; TOTAL HARMONIC DISTORTION (THD);

SIGNAL TO NOISE RATIO;

EID: 67349125431     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.2009205     Document Type: Article

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