ADC standard and testing in Japanese industry

Computer Standards and Interfaces

Volumn 23, Issue 1, 2001, Pages 57-64

  Kobayashi, Haruo ^a   Kobayashi, Kensuke ^b   Sakayori, Hiroshi ^c   Kimura, Yasuyuki ^d  

^a GUNMA UNIVERSITY   (Japan)

^b Teratec Corporation   (Japan)

^c YOKOGAWA ANALYTICAL SYSTEMS INC   (Japan)

^d SANYO ELECTRIC CO LTD   (Japan)

Author keywords

ADC; Industry; Japan; Standard; Testing

Indexed keywords

ENGINEERS; STANDARDS;

ANALOG TO DIGITAL CONVERSION TESTING;

ANALOG TO DIGITAL CONVERSION;

EID: 0034923567     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(00)00067-2     Document Type: Article

References (2)