Combined spectral and histogram analysis for fast ADC testing

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 4, 2005, Pages 1617-1623

  Serra, António Cruz ^a   da Silva, Manuel Fonseca ^a   Ramos, Pedro M ^a   Martins, Raul Carneiro ^a   Michaeli, Linus ^b   Šaliga, Ján ^b  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b TECHNICAL UNIVERSITY OF KO ICE   (Slovakia)

Author keywords

ADC testing; Analog to digital converter (ADC) modeling; Histogram analysis; Sine fitting; Waveform fitting

Indexed keywords

HARMONIC ANALYSIS; MATHEMATICAL MODELS; POLYNOMIAL APPROXIMATION; SPECTRUM ANALYSIS; STATISTICAL METHODS; TIME DOMAIN ANALYSIS;

HISTOGRAM ANALYSIS; SINE FITTING; WAVEFORM FITTING;

ANALOG TO DIGITAL CONVERSION;

EID: 23344452098     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.851057     Document Type: Article

References (8)

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