Analysis of resonance enhancement in defect-mediated silicon micro-ring photodiodes operating at 1550nm

Journal of Optics

Volumn 13, Issue 12, 2011, Pages

  Logan, D F ^a   Murray, K J ^a   Ackert, J J ^a   Velha, P ^b   Sorel, M ^b   De La Rue, R M ^b,c   Jessop, P E ^a,d   Knights, A P ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c UNIVERSITY OF MALAYA   (Malaysia)

^d WILFRID LAURIER UNIVERSITY   (Canada)

Author keywords

photo detector; photodiode; resonance enhancement; silicon photonics

Indexed keywords

DEFECTS; IMAGE ENHANCEMENT; PHOTODIODES; PHOTONIC DEVICES;

DEFECT CONCENTRATIONS; DEFECT CONTENTS; DESIGN METHODOLOGY; PEAK RESPONSIVITY; PHOTONIC APPLICATION; POST PROCESSING; RESONANCE ENHANCEMENT; RESONANT ENHANCEMENTS;

SILICON PHOTONICS;

EID: 83755168023     PISSN: 20408978     EISSN: 20408986     Source Type: Journal    
DOI: 10.1088/2040-8978/13/12/125503     Document Type: Article

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