Enhanced dielectric and piezoelectric response in PZT superlattice-like films by leveraging spontaneous Zr/Ti gradient formation

Acta Materialia

Volumn 60, Issue 3, 2012, Pages 1346-1352

  Bastani, Yaser ^a   Bassiri Gharb, Nazanin ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Chemical solution deposition; Ferroelectric; Piezoelectricity; PZT thin films; Superlattice

Indexed keywords

AVERAGE COMPOSITION; CHEMICAL ROUTES; CHEMICAL SOLUTION DEPOSITION; COMPOSITIONAL GRADIENTS; DEPTH PROFILE; DIELECTRIC AND PIEZOELECTRIC PROPERTIES; DIELECTRIC PERMITTIVITIES; DIELECTRIC RESPONSE; ELECTRICAL DIPOLES; FERROELECTRIC; FILM SURFACES; GRADIENT FORMATION; HIGH ORDER; IN-PLANE; ORIENTED THIN FILMS; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC RESPONSE; PROCESSING METHOD; PZT; PZT THIN FILM; SATELLITE PEAKS; SECONDARY PHASIS; STACKING PERIODICITY; STRUCTURAL REFINEMENT; TETRAGONAL PHASIS; XRD;

CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DEPOSITION; FERROELECTRIC FILMS; FERROELECTRICITY; LEAD; PERMITTIVITY; PIEZOELECTRICITY; SUPERLATTICES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; ZIRCONIUM;

DIELECTRIC MATERIALS;

EID: 83655197943     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.11.030     Document Type: Article

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