Design and Control of Atomic Force Microscopes

Proceedings of the American Control Conference

Volumn 5, Issue , 2003, Pages 3714-3719

  El Rifai, Osamah M ^a   Youcef Toumi, Kamal ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; COMPUTER SIMULATION; FEEDBACK CONTROL; FREQUENCY RESPONSE; SYSTEMS ANALYSIS;

FEEDBACK BANDWIDTH;

THREE TERM CONTROL SYSTEMS;

EID: 0142231365     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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2. Stavely Sensors Inc., EBL Product Line Catalog, 91 Prestige Park Circle, East Hartford, CT 06108-1918.
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5. T. Bouhacina, D. Michel, J. P. Aime, and S. Gauthier. Oscillation of the Cantilever in Atomic Force Microscopy: Probing the Sample Response at the Microsecond Scale, Journal of Applied Physics, Vol. 82, 1997, pp. 3652-3660.
6. G. Y. Chen, R. J. Warmack, A. Huang, and T. Thundat, Harmonic Response of Near-Contact Scanning Force Microscopy, Journal of Applied Physics, Vol. 78, 1995, pp. 1465-1469.
7. O. M. El Rifai, and K. Youcef-Toumi, Dynamics of Contact-mode Atomic Force Microscopes, American Control Conference, Chicago, Illinois, USA, June 2830, pp. 2118-2122, 2000.
8. O. M. El Rifai, and K, Youcef-Toumi, Coupling in Piezoelectric Tube Scanners Used in Scanning Probe Microscopes, American Control Conference, Arlington, Virginia, USA, June 25-27, pp. 3251-3255, 2001.
9. nd IFAC Conference on Mechatronic Systems, Berkeley, CA, USA, December 9-11, 2002.
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