Dynamics of atomic force microscopes: Experiments and simulations

IEEE Conference on Control Applications - Proceedings

Volumn 2, Issue , 2002, Pages 1126-1131

  El Rifai, Osamah M ^a   Youcef Toumi, Kamal ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DAMPING; IMAGE ANALYSIS; PARAMETER ESTIMATION; SURFACE TOPOGRAPHY;

ATOMIC FORCE MICROSCOPES;

ATOMIC FORCE MICROSCOPY;

EID: 0036033306     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Taylor M.E., Dynamics of Piezoelectric Tube Scanners for Scanning Probe Microscopy, Review of Scientific Instruments Vol. 64 (1), pp. 154-158, January 1993.
2. N.A. Burnham, O.P. Behrend, F. Oulevey, G. Gremaud, P.-J. Gallo, D. Gourdon, E. Dupas, A.J. Kuilk, H.M. Pollock, and G.A. Briggs, How Does a Tip Tap, Nanotech., Vol. 8, pp. 67-75, 1997.
3. T. Bouhacina, D. Michel, J.P. Aline, and S. Gauthier, Oscillation of the Cantilever in Atomic Force Microscopy: Probing the Sample Response at the Microsecond Scale, Journal of Applied Physics, Vol. 82, 1997, pp. 3652-3660.
4. G.Y. Chen, R.J. Warmack, A. Huang, and T. Thundat, Harmonic Response of Near-Contact Scanning Force Microscopy, Journal of Applied Physics, Vol. 78, 1995, pp. 1465-1469.
5. El Rifai, Osamah M., and Youcef-Toumi, Kamal, Dynamics of Contact-mode Atomic Force Microscopes, American Control Conference, Chicago, Illinois, USA, June 28-30, 2000.
6. El Rifai, Osamah M., and Youcef-Toumi, Kamal, Coupling in Piezoelectric Tube Scanners Used in Scanning Probe Microscopes, American Control Conference, Arlington, Virginia, USA, June 25-27, 2001.