Lognormal and Weibull accelerated life test plans under distribution misspecification

IEEE Transactions on Reliability

Volumn 54, Issue 1, 2005, Pages 43-52

  Pascual, Francis G ^a   Montepiedra, Grace ^b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b CENTER FOR BIOSTATISTICS IN AIDS RESEARCH   (United States)

Author keywords

Asymptotic bias; Asymptotic mean square error; Optimal test plans; Relative efficiency; Type I censoring

Indexed keywords

MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TESTS; ASYMPTOTIC BIAS; ASYMPTOTIC MEAN SQUARE ERROR; OPTIMAL TEST PLANS; RELATIVE EFFICIENCY;

RELIABILITY THEORY;

EID: 15544378561     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2004.837316     Document Type: Article

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