Degradation analysis and related topics: Some thoughts and a review

Proceedings of the National Science Council, Republic of China, Part A: Physical Science and Engineering

Volumn 23, Issue 5, 1999, Pages 555-566

  Chao, Min Te ^a  

^a ACADEMIA SINICA   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; DETERIORATION; LIFE CYCLE; MATHEMATICAL MODELS; RANDOM PROCESSES;

ACCELERATED LIFE TESTING; S-SHAPED CURVES; STEP-STRESS MODELS;

DEGRADATION;

EID: 0032670283     PISSN: 02556588     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (63)