Application independent evaluation of electromagnetic emissions for integrated circuits by the measurement of conducted signals

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 1998, Pages 219-224

  Pfaff, W R ^a  

^a ROBERT BOSCH GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; INTEGRATED CIRCUIT LAYOUT; LOGIC CIRCUITS; MICROPROCESSOR CHIPS; VOLTAGE MEASUREMENT;

SIGNAL MEASUREMENT;

ELECTROMAGNETIC WAVE EMISSION;

EID: 0032279432     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)