Stress-affected and stress-affecting instabilities during the growth of anodic oxide films

Electrochimica Acta

Volumn 56, Issue 28, 2011, Pages 10507-10515

  Van Overmeere, Q ^a   Proost, J ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

Anodic zirconia; Breakdown; Internal stress; Pore initiation; Porous anodic alumina

Indexed keywords

ANODIC OXIDE FILM; ANODISING; BREAKDOWN; DRIVING FORCES; ELECTROCHEMICAL CHARACTERISTICS; FUNDAMENTAL PARAMETERS; GALVANOSTATICS; GROWTH INSTABILITY; IN-SITU; INSTABILITY EVENTS; INTERNAL STRESS; MECHANICAL BEHAVIOUR; PHASE TRANSFORMATION; PORE FORMATION; PORE INITIATION; POROUS ANODIC ALUMINA;

ALUMINA; ANODIC OXIDATION; STRESSES; ZIRCONIA; ZIRCONIUM;

OXIDE FILMS;

EID: 81255214983     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2011.03.123     Document Type: Conference Paper

References (38)

1. M.M. Lohrengel Mater. Sci. Eng. R11 1993 243
2. J. Yahalom, and T.P. Hoar Electrochim. Acta 15 1970 877
3. F. Di Quarto, S. Piazza, and C. Sunseri J. Electrochem. Soc. 131 1984 2901
4. G.C. Wood, and J.P. O'Sullivan Electrochim. Acta 15 1970 1865
5. A. Ghicov, and P. Schmuki Chem. Commun. 20 2009 2791
6. J. Yahalom, and J. Zahavi Electrochim. Acta 15 1970 1429
7. J.S. Leach, and B.P. Pearson Corros. Sci. 28 1988 43
8. K.S. Raja, M. Misra, and K. Paramguru Electrochim. Acta 51 2001 154
9. M. Drese, and R.J. Wuttig J. Appl. Phys. 99 2006 123517
10. Q. Van Overmeere, J.-F. Vanhumbeeck, and J. Proost Rev. Sci. Instrum. 81 2010 045106
11. C.K. Dyer, and J.S.L. Leach J. Electrochem. Soc. 125 1978 1032
12. J.-F. Vanhumbeeck, L. Ryelandt, and J. Proost Electrochim. Acta 54 2009 3330
13. G.C. Wood, and C. Pearson Corros. Sci. 7 1967 119
14. K. Shimizu, G.E. Thompson, and G.C. Wood Thin Solid Films 92 1982 231
15. Y. Li, H. Shimada, M. Sakairi, K. Shigyo, H. Takahashi, and M. Seo J. Electrochem. Soc. 144 1997 866
16. T. Pauporté, and J. Finne J. Appl. Electrochem. 36 2006 33
17. Q. Van Overmeere, and J. Proost Electrochim. Acta 55 2010 4653
18. Q. Van Overmeere, "The role of internal stress on the growth and breakdown of barrier and porous anodic oxide films", PhD thesis, Université catholique de Louvain, p. 182-183 (2011), full text available on-line at http://hdl.handle.net/2078.1/69201.
19. D.A. Vermilyea J. Electrochem. Soc. 104 1957 542
20. Q. Van Overmeere, F. Blaffart, and J. Proost Electrochem. Commun. 12 2010 1174
21. H. Habazaki, M. Uozumi, H. Konno, K. Shimizu, P. Skeldon, and G.E. Thompson Corros. Sci. 45 2003 2063
22. J.-F. Vanhumbeeck, and J. Proost J. Electrochem. Soc. 155 2008 C506
23. K. Shimizu Electrochim. Acta 26 1981 1691
24. J.M. Albella, I. Montero, and J.M. Martinez-Duart Electrochim. Acta 32 1987 255
25. J. Proost, J.-F. Vanhumbeeck, and Q. Van Overmeere Electrochim. Acta 55 2009 350
26. Y. Shkel, and D. Klingenberg J. Appl. Phys. 83 1998 7834
27. H. Habazaki, K. Shimizu, S. Nagata, K. Asami, K. Takayama, Y. Oda, P. Skeldon, and G.E. Thompson Thin Solid Films 479 2005 144
28. J.W. Hutchinson, and Z. Suo Mixed-mode cracking in layered materials Adv. Appl. Mech. 29 1992 63
29. J. Schefold, D. Lincot, A. Ambard, and O. Kerrec J. Electrochem. Soc. 150 2003 B451
30. V.P. Parkhutik Corros. Sci. 26 1986 295
31. J.W. Diggle, T.C. Downie, and C.W. Goulding Chem. Rev. 69 1969 365
32. T.W. Hickmott J. Appl. Phys. 89 2001 5502
33. Q. Van Overmeere, B. Nysten, and J. Proost Appl. Phys. Lett. 94 2009 074103
34. V. Gill, P.R. Guduru, and B.W. Sheldon Int. J. Solids Struct. 45 2008 943
35. S.J. Garcia-Vergara, P. Skeldon, G.E. Thompson, and H. Habazaki Electrochim. Acta 52 2006 681
36. J.E. Houser, and K.R. Hebert Nat. Mater. 8 2009 415
37. D. Mercier, Q. Van Overmeere, R. Santoro, and J. Proost Electrochim. Acta 56 2011 1329
38. J. Proost, and F. Spaepen J. Appl. Phys. 91 2002 204